Computer storage devices
SATA Storage Technology
Don Anderson; MindShare
The cache memory book
Jim Handy
Charge-Trapping Non-Volatile Memories
Panagiotis Dimitrakis
Inside Solid State Drives Ssds
Kam Eshghi
NAND Flash Memory Technologies
Seiichi Aritome
Memory systems
Bruce Jacob
Digital Storage in Consumer Electronics
Thomas M. Coughlin
Non-Volatile Memories
Pierre-Camille Lacaze
The Essential Guide to Computer Data Storage
Andrei Khurshudov
Silicon Non-Volatile Memories
Barbara de Salvo
High Performance Memory Testing
R. Dean Adams
Using floppy disks with the BBC Microcomputer.
Keith Davis
Random Abstract Memory
Hattie Hayridge
The Cache Memory
Jim Handy
Memories for the Intelligent Internet of Things
Betty Prince
Resistive Random Access Memory (RRAM)
Shimeng Yu
Digital storage systems
William Renwick
Redis
Jay A. Kreibich
High-speed memory systems
A. V. Pohm
Electronic computer memory technology.
Wallace B. Riley
Developments in data storage
S. N. Piramanayagam
Inside Solid State Drives
Rino Micheloni
Virtual memory
Peter J. Denning
The Art of Memory Forensics
Andrew Case
Storage Policies and Maintenance Support Strategies in Warehousing Systems
Xiaolong Guo
More Than Moore Technologies for Next Generation Computer Design
Rasit O. Topaloglu
Inside NAND Flash Memories
Rino Micheloni
Proceedings of the fourteenth IEEE Symposium on Mass Storage Systems
IEEE Symposium on Mass Storage Systems (14th 1995 Monterey, Calif.)
Bigelow's drive and memory troubleshooting pocket reference
Stephen J. Bigelow
Advances in Non-Volatile Memory and Storage Technology
Yoshio Nishi
Emerging memories
Betty Prince
Memory System
Bruce Jacob
Digital computers' memory technology
D. Dutta Majumder
Advanced Test Methods for SRAMs
Alberto Bosio
The Galaxy memory system
James Chester Looney
Cache-based error recovery for shared memory multiprocessor systems
Kun-Lung Wu
Digital storage systems
William Renwick
Ci shi dai ji yi ti fa zhan qu shi yu Taiwan chan ye ji hui fen xi =
Junru Chen
Sensing of Non-Volatile Memory Demystified
Swaroop Ghosh
Multi-run Memory Tests for Pattern Sensitive Faults
Ireneusz Mrozek
